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Semiconductor chip's quality analysis based on its high dimensional test data - MaRDI portal

Semiconductor chip's quality analysis based on its high dimensional test data (Q2115804)

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scientific article; zbMATH DE number 7494099
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English
Semiconductor chip's quality analysis based on its high dimensional test data
scientific article; zbMATH DE number 7494099

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    Semiconductor chip's quality analysis based on its high dimensional test data (English)
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    21 March 2022
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    data processing
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    quality-spectrum
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    industrial electronics
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    quality control
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