Geometrically nonlinear stress-deflection relations for thin film/substrate systems (Q2368255)

A previously developed [the authors and \textit{D. E. Fahnline}, Mater. Res. Soc. Proc. 188, 21-27 (1990)] geometrically nonlinear stress-curvature relation is expanded in this paper to allow for a less restrictive approximation of the midplane strains in a thin film/substrate system. The previous analysis is based on a minimization of the total strain energy and predicts a bifurcation in shape as the magnitude of intrinsic film stress increases. It is reviewed here and three new cases are presented.