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Sensitivity vector fields for atomic force microscopes - MaRDI portal

Sensitivity vector fields for atomic force microscopes (Q2380539)

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Sensitivity vector fields for atomic force microscopes
scientific article

    Statements

    title
    Sensitivity vector fields for atomic force microscopes (English)
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    author
    Joosup Lim
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    Bogdan I. Epureanu
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    publication date
    29 March 2010
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    zbMATH Keywords
    atomic force microscopy
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    nonlinear systems
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    system interrogation
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    Identifiers

    zbMATH DE Number
    5687081
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    OpenAlex ID
    W2117756851
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