Simulations of 3-D domain wall structures in thin films (Q2493503)

Based on the Gauss-Seidel projection method, the authors simulate the 3D domain wall structures for thin films at various thickness. The authors observe transition from Néel wall to cross-tie wall and to Bloch wall as the thickness is increased. Periodic structures for cross-tie wall are also studied. The results are in a good agreement with experimental observations. Hysteresis loops are calculated for samples of various sizes. In particular, the effect of cross-tie wall in the switching process is studied. Those simulations have demonstrated the high efficiency of the Gauss-Seidel projection method. This method is an important tool for the numerical simulation of the Landau-Lifshitz-Gilbert equation.