Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions (Q2720636)
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scientific article; zbMATH DE number 1611461
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions |
scientific article; zbMATH DE number 1611461 |
Statements
27 June 2001
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Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions (English)
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