Structural approach to functional faults testing in discrete devices (Q2720921)
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scientific article; zbMATH DE number 1611725
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Structural approach to functional faults testing in discrete devices |
scientific article; zbMATH DE number 1611725 |
Statements
2 July 2001
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test generation
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functional single-state transition fault
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sequential discrete devices
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symbolic simulation
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Structural approach to functional faults testing in discrete devices (English)
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A new test generation method of functional single-state transition faults for sequential discrete devices on the gate description level is suggested. Proposed method is based on application of symbolic simulation algorithm of single-state transition faults. Universal 16-valued alphabet and characteristic multivalued functions are applied. Given approach allows generate tests for functional single-state transition faults on the gate description level and combines advantages of finite state machine and structural methods of diagnostic experiments generation for sequential devices.
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