Structural approach to functional faults testing in discrete devices (Q2720921)

A new test generation method of functional single-state transition faults for sequential discrete devices on the gate description level is suggested. Proposed method is based on application of symbolic simulation algorithm of single-state transition faults. Universal 16-valued alphabet and characteristic multivalued functions are applied. Given approach allows generate tests for functional single-state transition faults on the gate description level and combines advantages of finite state machine and structural methods of diagnostic experiments generation for sequential devices.