The parallel simulation of functional single-state-transition faults (Q2735900)

The problem of fault simulation for sequential digital devices is considered. New parallel simulation method of functional single-state-transition faults for finite state machine on gate level description is proposed. The simulation is realized in the multivalued alphabet that is a subset of the universal 16-valued alphabet \(B_{16}\). Using functional single-state-transition fault model allows to reduce a number of simulated faults and consequently allows essentially to reduce simulation time in comparison with methods utilizing the stuck-at fault model. Also single-state-transition fault model allows to increase an accuracy of the fault coverage estimation.