Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals (Q2838804)
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scientific article; zbMATH DE number 6183611
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals |
scientific article; zbMATH DE number 6183611 |
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Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals (English)
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3 July 2013
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semiconductor
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photon crystal
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waveguide
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refraction coefficient
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residual function
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0.9406311
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0.84312546
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0.8357683
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0.83408976
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0.8328383
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0.8244906
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0.82118255
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Numerical calculations were performed to study the parameters of the electromagnetic wave propagation through a multilayer-filled photon crystal waveguide.
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