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Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction - MaRDI portal

Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction (Q2985722)

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Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction
scientific article

    Statements

    title
    Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction (English)
    0 references
    author
    Lin-Feng Chen
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    Aijiao Cui
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    Chip-Hong Chang
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    publication date
    16 May 2017
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    Identifiers

    zbMATH DE Number
    6716246
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    OpenAlex ID
    W2085041803
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