Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays (Q2995727)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays |
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Direct and inverse problems of determining the parameters of multilayer nanostructures from the angular spectrum of the intensity of reflected X-rays (English)
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4 May 2011
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methods for determining parameters of multilayer nanostructures
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mathematical modeling
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finite difference method
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approximation-combinatorial method
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