Pattern analysis and metrology: the extraction of stable features from observable measurements (Q3024587)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Pattern analysis and metrology: the extraction of stable features from observable measurements |
scientific article |
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Pattern analysis and metrology: the extraction of stable features from observable measurements (English)
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1 July 2005
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morphological closing filters
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motif analysis
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measurement theory
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pattern analysis
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