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Automatic test generation algorithms for analogue circuits - MaRDI portal

Automatic test generation algorithms for analogue circuits (Q3126029)

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English
Automatic test generation algorithms for analogue circuits
scientific article

    Statements

    title
    Automatic test generation algorithms for analogue circuits (English)
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    publication date
    23 March 1997
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    zbMATH Keywords
    automatic test generation
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    analogue circuits
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    Identifiers

    zbMATH DE Number
    993831
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    OpenAlex ID
    W2155238908
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