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Design of universal test sequences for VLSI - MaRDI portal

Design of universal test sequences for VLSI (Q3220498)

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scientific article
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English
Design of universal test sequences for VLSI
scientific article

    Statements

    title
    Design of universal test sequences for VLSI (English)
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    author
    Abraham Lempel
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    Martin Cohn
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    publication date
    1985
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    Identifiers

    zbMATH DE Number
    3885801
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