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Fast test generation for m-logic combinational circuits - MaRDI portal

Fast test generation for m-logic combinational circuits (Q3481653)

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Fast test generation for m-logic combinational circuits
scientific article

    Statements

    title
    Fast test generation for m-logic combinational circuits (English)
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    publication date
    1989
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    zbMATH Keywords
    fast test generation algorithm
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    M-difference
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    m-logic combinational circuits
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    cites work
    Q4159312
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    Identifiers

    zbMATH DE Number
    4152318
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    OpenAlex ID
    W2082951867
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