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Design of test sequences for VLSI self-testing using LFSR - MaRDI portal

Design of test sequences for VLSI self-testing using LFSR (Q3484763)

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Design of test sequences for VLSI self-testing using LFSR
scientific article

    Statements

    title
    Design of test sequences for VLSI self-testing using LFSR (English)
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    publication date
    1990
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    zbMATH Keywords
    linear feedback shift register
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    maximum length
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    VLSI self-testing
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    Identifiers

    DOI
    10.1109/18.52485
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    zbMATH DE Number
    4156357
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    OpenAlex ID
    W2149459130
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