Estimation of thermal resistance distributions for die-attach testing in microelectronics (Q3604084)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Estimation of thermal resistance distributions for die-attach testing in microelectronics |
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Estimation of thermal resistance distributions for die-attach testing in microelectronics (English)
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24 February 2009
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Inverse heat conduction
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Microelectronics
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Defect detection
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Distribution estimation
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