Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects (Q3614597)
From MaRDI portal
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects |
scientific article |
Statements
Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects (English)
0 references
9 March 2009
0 references
built-in self-test
0 references
crosstalk faults
0 references
DSM interconnects
0 references
fault model
0 references
test patterns
0 references
