Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing (Q3659697)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing |
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Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing (English)
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1983
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linear feedback shift registers
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primitive polynomials
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VLSI self-testing
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