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Test Generation for Microprocessors - MaRDI portal

Test Generation for Microprocessors (Q3877584)

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Test Generation for Microprocessors
scientific article

    Statements

    title
    Test Generation for Microprocessors (English)
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    author
    Satish M. Thatte
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    Jacob A. Abraham
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    publication date
    1980
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    zbMATH Keywords
    architecture models
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    complexity of tests
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    functional level fault models
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    microprocessor architecture
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    test programs
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    Identifiers

    zbMATH DE Number
    3681667
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    OpenAlex ID
    W1823755974
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