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A Nine-Valued Circuit Model for Test Generation - MaRDI portal

A Nine-Valued Circuit Model for Test Generation (Q4093344)

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scientific article; zbMATH DE number 3513675
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English
A Nine-Valued Circuit Model for Test Generation
scientific article; zbMATH DE number 3513675

    Statements

    title
    A Nine-Valued Circuit Model for Test Generation (English)
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    author
    Peter Muth
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    publication date
    1976
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    Identifiers

    zbMATH DE Number
    3513675
    0 references
     
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