Burn-in considering yield loss and reliability gain for integrated circuits (Q421527)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Burn-in considering yield loss and reliability gain for integrated circuits |
scientific article; zbMATH DE number 6035007
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Burn-in considering yield loss and reliability gain for integrated circuits |
scientific article; zbMATH DE number 6035007 |
Statements
Burn-in considering yield loss and reliability gain for integrated circuits (English)
0 references
14 May 2012
0 references
reliability
0 references
defect growth
0 references
defect size distribution
0 references
negative binomial defect density
0 references
0.8376563
0 references
0.8361335
0 references
0.8296761
0 references
0.8035434
0 references
