IDDQ testing: state of the art and future trends (Q4225370)
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scientific article; zbMATH DE number 1238922
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | IDDQ testing: state of the art and future trends |
scientific article; zbMATH DE number 1238922 |
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IDDQ testing: state of the art and future trends (English)
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12 January 1999
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\(I_{DDQ}\) testing
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defect modeling
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ATPG
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current sensors
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BICS
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leakage currents
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CMOS scaling trends
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