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SIMULATION OF FIELD EMISSION FROM SILICON: SELF‐CONSISTENT CORRECTIONS USING THE WIGNER DISTRIBUTION FUNCTION - MaRDI portal

SIMULATION OF FIELD EMISSION FROM SILICON: SELF‐CONSISTENT CORRECTIONS USING THE WIGNER DISTRIBUTION FUNCTION (Q4315351)

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scientific article; zbMATH DE number 700448
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English
SIMULATION OF FIELD EMISSION FROM SILICON: SELF‐CONSISTENT CORRECTIONS USING THE WIGNER DISTRIBUTION FUNCTION
scientific article; zbMATH DE number 700448

    Statements

    SIMULATION OF FIELD EMISSION FROM SILICON: SELF‐CONSISTENT CORRECTIONS USING THE WIGNER DISTRIBUTION FUNCTION (English)
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    8 December 1994
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    self-consistent corrections
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    semiconductor
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    Wigner distribution function
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    simulation of field emission
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    band bending
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    scattering
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    Identifiers

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