Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers (Q4419636)
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scientific article; zbMATH DE number 1964032
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers |
scientific article; zbMATH DE number 1964032 |
Statements
Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers (English)
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1995
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decompression
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multiple-polynomial LFSR
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scan design
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