Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits (Q4419712)
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scientific article; zbMATH DE number 1964083
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits |
scientific article; zbMATH DE number 1964083 |
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Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits (English)
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1995
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defect tolerance
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model equivalence
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