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Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections - MaRDI portal

Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections (Q4520151)

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scientific article; zbMATH DE number 1542291
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Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections
scientific article; zbMATH DE number 1542291

    Statements

    Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections (English)
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    12 December 2000
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    coupling noise
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    signal activity
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    delay uncertainty
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    deep submicrometer
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    CMOS integrated circuits
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    interconnect
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    VLSI
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