Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition (Q4671324)
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scientific article; zbMATH DE number 2161419
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition |
scientific article; zbMATH DE number 2161419 |
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Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition (English)
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26 April 2005
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