Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability (Q4883213)
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scientific article; zbMATH DE number 895098
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability |
scientific article; zbMATH DE number 895098 |
Statements
Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability (English)
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13 October 1996
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quality management
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screening
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empirical Bayes approach
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bad chips
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