Integral evaluation in semiconductor device modelling using simulated annealing with Bose–Einstein statistics (Q5295476)
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scientific article; zbMATH DE number 5175447
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Integral evaluation in semiconductor device modelling using simulated annealing with Bose–Einstein statistics |
scientific article; zbMATH DE number 5175447 |
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Integral evaluation in semiconductor device modelling using simulated annealing with Bose–Einstein statistics (English)
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30 July 2007
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genetic algorithms
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simulated annealing
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Bose-Einstein statistics
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Bose-Einstein condensation
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Tsallis statistics
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HEMT
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