1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. I: Computation of the initial secondary electron emission yield (Q534885)
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scientific article; zbMATH DE number 5886532
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | 1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. I: Computation of the initial secondary electron emission yield |
scientific article; zbMATH DE number 5886532 |
Statements
1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. I: Computation of the initial secondary electron emission yield (English)
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10 May 2011
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secondary electron emission yield
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two-fluxes method
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finite-volume computation
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0.8172885
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0.80369854
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0.7992729
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