Self-Testing of Universal and Fault-Tolerant Sets of Quantum Gates (Q5386215)
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scientific article; zbMATH DE number 5265806
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Self-Testing of Universal and Fault-Tolerant Sets of Quantum Gates |
scientific article; zbMATH DE number 5265806 |
Statements
Self-Testing of Universal and Fault-Tolerant Sets of Quantum Gates (English)
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22 April 2008
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self-testing
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quantum circuit
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fault-tolerance
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robustness
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