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One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction - MaRDI portal

One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction (Q5444491)

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scientific article; zbMATH DE number 5240603
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One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction
scientific article; zbMATH DE number 5240603

    Statements

    One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction (English)
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    25 February 2008
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    automated inspection
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    computer vision
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    defect detection
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    thin film transistor-liquid crystal display (TFT-LCD)
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    Fourier transforms
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    Identifiers