A new adaptive multi‐bias <i>S</i>‐parameter measurement algorithm for transistor characterization (Q5463625)
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scientific article; zbMATH DE number 2192618
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A new adaptive multi‐bias <i>S</i>‐parameter measurement algorithm for transistor characterization |
scientific article; zbMATH DE number 2192618 |
Statements
A new adaptive multi‐bias <i>S</i>‐parameter measurement algorithm for transistor characterization (English)
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5 August 2005
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adaptive
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S-parameter
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characterization
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multi-bias
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transistor
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modelling
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non-linear
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