Simulation of longitudinal instabilities in filamentary current flow during low‐temperature impurity breakdown in semiconductors (Q5704832)
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scientific article; zbMATH DE number 2229420
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Simulation of longitudinal instabilities in filamentary current flow during low‐temperature impurity breakdown in semiconductors |
scientific article; zbMATH DE number 2229420 |
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Simulation of longitudinal instabilities in filamentary current flow during low‐temperature impurity breakdown in semiconductors (English)
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15 November 2005
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simulation
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semiconductors
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current filaments
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instabilities
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