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Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach - MaRDI portal

Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach (Q5856186)

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scientific article; zbMATH DE number 7327345
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Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach
scientific article; zbMATH DE number 7327345

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    Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach (English)
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    24 March 2021
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    inverse problem
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    noniterative reconstruction method
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    Kohn-Vogelius formulation
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    topological sensitivity analysis
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    topology optimization
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