A Nondestructive Technique to Identify and Localize Microscopic Defects on a Microstrip Line (Q5857253)
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scientific article; zbMATH DE number 7329909
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A Nondestructive Technique to Identify and Localize Microscopic Defects on a Microstrip Line |
scientific article; zbMATH DE number 7329909 |
Statements
A Nondestructive Technique to Identify and Localize Microscopic Defects on a Microstrip Line (English)
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31 March 2021
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impedance
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overflow
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narrow transverse slit
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scattering parameter
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inverse Fourier transform
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