On-chip evaluation of voltage drops and fault occurrence induced by Si backside EM injection (Q6630405)
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scientific article; zbMATH DE number 7936530
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | On-chip evaluation of voltage drops and fault occurrence induced by Si backside EM injection |
scientific article; zbMATH DE number 7936530 |
Statements
On-chip evaluation of voltage drops and fault occurrence induced by Si backside EM injection (English)
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31 October 2024
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fault attacks
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EM fault injection
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power delivery networks
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integrated circuit
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