Finite difference method and analysis for three-dimensional semiconductor device of heat conduction (Q674709)
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scientific article; zbMATH DE number 987540
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Finite difference method and analysis for three-dimensional semiconductor device of heat conduction |
scientific article; zbMATH DE number 987540 |
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Finite difference method and analysis for three-dimensional semiconductor device of heat conduction (English)
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2 August 1998
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The mathematical model of the three-dimensional semiconductor devices of heat conduction is described by a system of four quasilinear partial differential equations for initial-boundary value problems. One equation in elliptic form is for the electric potential; two equations of convection-dominated diffusion type are for the electron and hole concentration; and one heat conduction equation is for temperature. Characteristic finite difference schemes for two kinds of boundary value problems are put forward. By using thick and thin grids to form a complete set and treating the product threefold-quadratic interpolation, a variable time step method with the boundary condition, calculus of variations and the theory of prior estimates and techniques, optimal error estimates in \(L^2\) norm are derived in the approximate solutions.
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semiconductor devices
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heat conduction
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finite difference schemes
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variable time step method
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optimal error estimates
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