Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations (Q869281)
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scientific article; zbMATH DE number 5130263
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations |
scientific article; zbMATH DE number 5130263 |
Statements
Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations (English)
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2 March 2007
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thin film
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X-ray microdiffraction
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non-local stress/curvature relations
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