Layered critical values: a powerful direct-adjustment approach to discovering significant patterns

DOI10.1007/S10994-008-5046-XzbMath1470.68196DBLPjournals/ml/Webb08aOpenAlexW2030764200WikidataQ62833653 ScholiaQ62833653MaRDI QIDQ1009257

Geoffrey I. Webb

Publication date: 31 March 2009

Published in: Machine Learning (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10994-008-5046-x

zbMATH Keywords

association rulespattern discoverylayered critical valuessignificant patternssignificant rulesstatistical procedures

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Pattern recognition, speech recognition (68T10)

Cites Work

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• Discovering significant patterns
• 10.1162/jmlr.2003.3.4-5.833
• Detecting group differences: Mining contrast sets
• (DATASET) Online-Retail-II-UCI

Related Items (3)

A tutorial on statistically sound pattern discovery ⋮ Skopus: mining top-\(k\) sequential patterns under leverage ⋮ Computing exact permutation \(p\)-values for association rules

Uses Software

• UCI-ml

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