Design of accelerated life test sampling plans with a nonconstant shape parameter
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Publication:1014974
DOI10.1016/j.ejor.2008.07.009zbMath1159.91463OpenAlexW2171817903MaRDI QIDQ1014974
Publication date: 30 April 2009
Published in: European Journal of Operational Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ejor.2008.07.009
Weibull distributionaccelerated life test sampling planfailure-censorednonconstant shape parametertime-censored
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Cites Work
- One- and two-sided sampling plans based on the exponential distribution
- Life-Test Sampling Plans for Two-Parameter Weibull Populations
- Accelerated Testing
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
- Reliability sampling plans for the two-parameter exponential distribution under progressive censoring
- Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
- Accelerated life test sampling plans for exponential distributions
- Failure–censored reliability sampling plans for the exponential distribution
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