Effects of interface dislocations on properties of ferroelectric thin films

DOI10.1016/J.JMPS.2007.01.011zbMath1162.74400OpenAlexW2128440206MaRDI QIDQ1019364

C. H. Woo, Biao Wang, Yue Zheng

Publication date: 2 June 2009

Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jmps.2007.01.011

zbMATH Keywords

coercive fieldferroelectric thin filminterface dislocationsremnant polarizationself polarization

Mathematics Subject Classification ID

Electromagnetic effects in solid mechanics (74F15) Thin films (74K35) Finite difference methods applied to problems in solid mechanics (74S20)

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Cites Work

• Dislocation Dynamics at Low Temperatures

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