Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method

DOI10.1631/JZUS.A0820493zbMath1177.80028MaRDI QIDQ1045558

Shuo Huang, Xiao-Dong Ruan, Hua-Yong Yang, Xin Fu

Publication date: 15 December 2009

Published in: Journal of Zhejiang University. Science A (Search for Journal in Brave)

zbMATH Keywords

thermal conductivitydielectric thin filmsporous siliconsubmicrometer- or nanometer-scalethermal effect micro-systems (TEMS)

Mathematics Subject Classification ID

Lasers, masers, optical bistability, nonlinear optics (78A60) Experimental work for problems pertaining to classical thermodynamics (80-05)

Cites Work

• Unnamed Item

This page was built for publication: Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method