Repeated significance tests with biased coin allocation schemes

DOI10.1007/BF00324857zbMath0585.62134OpenAlexW2024197678MaRDI QIDQ1070723

Nancy E. Heckman

Publication date: 1986

Published in: Probability Theory and Related Fields (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf00324857

zbMATH Keywords

biased coin designrepeated significance testasymptotic error probabilitiessingle parameter exponential family

Mathematics Subject Classification ID

Sequential statistical design (62L05) Sequential statistical analysis (62L10)

Cites Work

• Unnamed Item
• A sequential probability ratio test using a biased coin design
• The adaptive biased coin design for sequential experiments
• A nonlinear renewal theory with applications to sequential analysis. I
• Repeated likelihood ratio tests for curved exponential families
• On Limiting Distributions for Sums of a Random Number of Independent Random Vectors
• Forcing a sequential experiment to be balanced