A testable design of programmable logic arrays with universal control and minimal overhead

DOI10.1016/0898-1221(87)90079-4zbMath0641.94041OpenAlexW2077157068MaRDI QIDQ1101084

K. K. Saluja, K. Kinoshita, Hideo Fujiwara

Publication date: 1987

Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0898-1221(87)90079-4

zbMATH Keywords

fault detectiondesign of easily testable PLAs

Mathematics Subject Classification ID

Cites Work

• Unnamed Item
• An Easily Testable Design of Programmable Logic Arrays for Multiple Faults
• A Design for Testability of Undetectable Crosspoint Faults in Programmable Logic Arrays
• A design of programmable logic arrays with universal tests

This page was built for publication: A testable design of programmable logic arrays with universal control and minimal overhead