Testable design of two-dimensional cellular logic arrays for detecting struck-at and bridging faults
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Publication:1119547
DOI10.1016/0045-7906(88)90011-0zbMath0671.94024OpenAlexW2055297299MaRDI QIDQ1119547
Gopal C. Basu, Bidyut Gupta, Bhargab Bikram Bhattacharya
Publication date: 1988
Published in: Computers and Electrical Engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/0045-7906(88)90011-0
Boolean functioncellular logic arrayscombinational logic arraysintegrated circuitsingle stuck-at and bridging faults
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