Fault diagnosis under a limited-fault assumption and limited test-point availability

DOI10.1007/BF01599922zbMath0669.94023OpenAlexW1999351338MaRDI QIDQ1119608

Lawrence Rapisarda, Ray DeCarlo

Publication date: 1988

Published in: Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf01599922

zbMATH Keywords

fault diagnosis for large interconnected circuitsfrequency domain tableauparameter diagnosability test

Mathematics Subject Classification ID

Uses Software

• IMSL Numerical Libraries

Cites Work

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• On a theory of t-fault diagnosable analog systems
• Analog multifrequency fault diagnosis
• Design of testability for analogue fault diagnosis
• Multiple-fault location of analog circuits
• Diagnosability of nonlinear circuits and systems-Part II: Dynamical systems
• A theory and an algorithm for analog circuit fault diagnosis

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