Programmable logic arrays with the properties of easy test generation

zbMath0792.94010MaRDI QIDQ1176070

Yinghua Min

Publication date: 25 June 1992

Published in: Science in China. Series A (Search for Journal in Brave)

zbMATH Keywords

combinational networksprogrammable logic arraydesign for testabilityeasy test generationpseudo-nonconcurrency

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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