Pseudo-random test generation for large combinational circuits

DOI10.1007/BF02946162zbMath0800.68254OpenAlexW2065021352MaRDI QIDQ1192494

Yinghua Min, Zhongcheng Li

Publication date: 27 September 1992

Published in: Journal of Computer Science and Technology (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf02946162

zbMATH Keywords

fault coveragelarge combinatorial circuitspseudo-random testing

Mathematics Subject Classification ID

Circuits, networks (94C99) Computer system organization (68M99)

Cites Work

• Random Pattern Testability
• On Random Pattern Test Length

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