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Complexity of tests checking the operation of logic diagram inputs

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Publication:1222626
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DOI10.1007/BF01461151zbMath0318.94030MaRDI QIDQ1222626

V. N. Noskov

Publication date: 1976

Published in: Mathematical Notes (Search for Journal in Brave)



Mathematics Subject Classification ID


Related Items (3)

On the relation between rough set reducts and typical testors ⋮ Test recognition ⋮ On tests detecting certain faults of circuit inputs for almost all Boolean functions



Cites Work

  • Bounds on the Length of Terminal Stuck-Fault Test




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